We have won the Best Paper Award at IPFA 2022 in Singapore!

In this study we used STEM EBIC to directly image dielectric breakdown in nanoscale resisitve memory elements. This is one of our favorite examples of how powerful STEM EBIC can be for studying device physics at high resolution.

We have been invited to give the talk again next month at ESREF 2022 in Berlin. Hope to see you there!