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NEI's Two Channel STEM EBIC System

  • Includes EBIC-optimized TEM biasing holder, current amplifiers and signal routing, and power and signal conditioning electronics.

  • High sensitivity, low noise current measurements.

      • Quantitative standard EBIC and SEEBIC imaging.

  • Two independent EBIC channels:

      • Distinguish between EBIC modes.

      • Probe different device regions simultaneously.

  • Designed for compatibility with in situ biasing and heating experiments.

  • EBIC-compatible substrates for liftout, patterned heating/biasing, and wet transfer samples.

Characterization Services

STEM EBIC Characterization

    •  Nanoscale electronic and thermal imaging:

        • Mapping Conductivity, Electric field, Temperature, Work function. 

Radiation Testing

TEM imaging and analysis

Sample Fabrication Services

Custom Si-based TEM biasing substrates:

      • Liftout chips for cross section samples.

      • Membrane chips for patterning devices and wet transfer of nanomaterials. 

Electrically contacted cross sections 

Custom nanoscale device fabrication:

    • Heating/biasing materials characterization platforms, prototype devices, test structures, etc.


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