Making Connections: Challenges and Opportunities for In Situ TEM Biasing
EDFA Magazine
NEI wins Best Paper Award at IPFA 2022 in Singapore, invited to give the talk again at ESREF 2022 in Berlin.
Presented to Regan and Hubbard for SEEBIC
First SEEBIC paper
Differential electron yield imaging with STXM
SEEBIC-Like Conductivity Mapping with an X-Ray Microscope
