NEI's STEM EBIC System has been chosen as one of the top innovations of the year by Microscopy Today Magazine!

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Making Connections: Challenges and Opportunities for In Situ TEM Biasing

NEI wins Best Paper Award at IPFA 2022 in Singapore, invited to give the talk again at ESREF 2022 in Berlin.

STEM EBIC reveals local conductivity and field changes associated with dielectric breakdown during resistive memory switching

("On the Cover" feature)

Generating and characterizing radiation damage with STEM EBIC

Presented to Regan and Hubbard for SEEBIC

Electronic activity previously invisible to electron microscopes revealed

STEM Imaging with Beam-Induced Hole and Secondary Electron Currents

First SEEBIC paper

Electron beam-induced current imaging with two-angstrom resolution

Differential electron yield imaging with STXM

SEEBIC-Like Conductivity Mapping with an X-Ray Microscope

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