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NEI's CEO named a 2025 Emerging Leader by the journal Nanotechnology. The Emerging Leaders collection feature's the article "Secondary Electron Emission Current Mapping for Nanoscale Thermometry" demonstrating the only TEM-based temperature mapping besides PEET (Science, 2015).
NEI's CEO named a 2025 Emerging Leader by the journal Nanotechnology. The Emerging Leaders collection feature's the article "Secondary Electron Emission Current Mapping for Nanoscale Thermometry" demonstrating the only TEM-based temperature mapping besides PEET (Science, 2015).
NEI's STEM EBIC System has been chosen as one of the top innovations of the year by Microscopy Today Magazine!
NEI's STEM EBIC System has been chosen as one of the top innovations of the year by Microscopy Today Magazine!
NEI wins Best Paper Award at IPFA 2022 in Singapore, invited to give the talk again at ESREF 2022 in Berlin.
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